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thin film measurement
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Axic Inc - Semiconductor Plasma, Rapid Thermal Processing and Thin Film Metrology Equipment Company Homepage
AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete ...
Asher
PECVD
Thickness Measurement
Plasma etcher
refractive index
Reflectometer
ellipsometer
optical measurement
LPCVD
ellipsometry
Plasma etch
Spectroscopic Ellipsometry
Thin Film Measurement
Spectroscopic Ellipsometer
Thin Film Metrology
Photoresist stripping
Reactive ion etch
Plasma deposition
Rapid thermal annealing
Reactive ion etcher
Thin Film Analysis
Rapid thermal anneal
Resist stripper
X-ray fluoresence
Diode etcher
ICP etch
ICP etcher
ICP PECVD
Photoresist stripper
Plasma wafer backside thinning
Rapid thermal processor
www.axic.com - 2009-02-07
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